J. Slinkman: search on Z-Library

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1

Analysis of snubber-clamped diode-string mixed voltage interface ESD protection network for advanced microprocessors

Steven H. Voldman, Gianfranco Gerosa, Vaughn P. Gross, Nicholas Dickson, Stephen Furkay, James Slinkman

Journal:

Journal of Electrostatics

Year:

1996

Language:

english

File:

PDF, 1.35 MB

english, 1996

2

Political-Economic Cycles in the U.S. Stock Market

Anthony F. Herbst and Craig W. Slinkman

Journal:

Financial Analysts Journal

Year:

1984

Language:

english

File:

PDF, 1.12 MB

english, 1984

3

[IEEE 2001 IEEE/SEMI Advanced Semiconductor Manufacturing Conference - Munich, Germany (23-24 April 2001)] 2001 IEEE/SEMI Advanced Semiconductor Manufacturing Conference (IEEE Cat. No.01CH37160) - Manufacturing optimization of shallow trench isolation for advanced CMOS logic technology

Speranza, T., Yutong Wu,, Fisch, E., Slinkman, J., Wong, J., Beyer, K.

Year:

2001

Language:

english

File:

PDF, 462 KB

english, 2001

4

Shallow trench isolation double-diobe electrostatic discharge circuit and interaction with DRAM output circuitry

Steven H. Voldman, Vaughn P. Gross, Michael J. Hargrove, James M. Never, James A. Slinkman, Martin P.O'Boyle, Tom S. Scott, Joseph J. Delecki

Journal:

Journal of Electrostatics

Year:

1993

Language:

english

File:

PDF, 1.79 MB

english, 1993

5

Framework for development of conceptual data modelling techniques

HD Crockett, J Guynes, CW Slinkman

Journal:

Information and Software Technology

Year:

1991

Language:

english

File:

PDF, 1.01 MB

english, 1991

6

[IEEE Proceedings of 17th Annual Electrical Overstress/Electrostatic Discharge Symposium - Phoenix, AZ, USA (1995.09.12-1995.09.14)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings - Analysis of snubber-clamped diode-string mixed voltage interface ESD protection network for advanced microprocessors

Voldman, S.H., Gerosa, G., Gross, V.P., Dickson, N., Furkay, S., Slinkman, J.

Year:

1995

Language:

english

File:

PDF, 1.61 MB

english, 1995

7

Lateral dopant profiling with 200 nm resolution by scanning capacitance microscopy

Williams, C. C., Slinkman, J., Hough, W. P., Wickramasinghe, H. K.

Journal:

Applied Physics Letters

Year:

1989

Language:

english

File:

PDF, 555 KB

english, 1989

8

Management of high technology: A path analytic study of stress and distress-strain

Bodensteiner, Wayne D., Gerloff, Edwin A., Quick, James Campbell, Slinkman, Craig

Journal:

The Journal of High Technology Management Research

Year:

1991

Language:

english

File:

PDF, 1.61 MB

english, 1991

9

[IEEE 2009 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) - San Diego, California, USA (2009.01.19-2009.01.21)] 2009 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - A Thin-Film SOI 180nm CMOS RF Switch Technology

Botula, A., Joseph, A., Slinkman, J., Wolf, R., He, Z.-X., Ioannou, D., Wagner, L., Gordon, M., Abou-Khalil, M., Phelps, R., Gautsch, M., Abadeer, W., Harmon, D., Levy, M., Benoit, J., Dunn, J.

Year:

2009

Language:

english

File:

PDF, 419 KB

english, 2009

10

[IEEE 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Kanazawa (2013.5.26-2013.5.30)] 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Lateral tapered active field-plate LDMOS device for 20V application in thin-film SOI

Abou-Khalil, Michel J., Letavic, Theodore J., Slinkman, James A., Joseph, Alvin J., Botula, Alan B., Jaffe, Mark D.

Year:

2013

Language:

english

File:

PDF, 2.05 MB

english, 2013

11

[IEEE 2013 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Seattle, WA, USA (2013.06.2-2013.06.4)] 2013 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) - Power handling capability of an SOI RF switch

Joseph, Alvin, Botula, Alan, Slinkman, James, Wolf, Randy, Phelps, Rick, Abou-Khalil, Michel, Ellis-Monaghan, John, Moss, Steven, Jaffe, Mark

Year:

2013

Language:

english

File:

PDF, 104 KB

english, 2013

12

Stress-induced dislocations in silicon integrated circuits

Fahey, P. M., Mader, S. R., Stiffler, S. R., Mohler, R. L., Mis, J. D., Slinkman, J. A.

Journal:

IBM Journal of Research and Development

Year:

1992

Language:

english

File:

PDF, 2.25 MB

english, 1992

13

Calculations of the spin dependence of transport and optical properties in wide parabolic quantum wells

Hembree, C. E., Mason, B. A., Kwiatkowski, J. T., Furneaux, J. E., Slinkman, J. A.

Journal:

Physical Review B

Year:

1994

Language:

english

File:

PDF, 1.23 MB

english, 1994

14

Subband spectrum of a parabolic quantum well in a perpendicular magnetic field

Hembree, C. E., Mason, B. A., Zhang, A., Slinkman, J. A.

Journal:

Physical Review B

Year:

1992

Language:

english

File:

PDF, 200 KB

english, 1992

15

mixtures

Ruvalds, J., Slinkman, J., Rajagopal, A. K., Bagchi, A.

Journal:

Physical Review B

Year:

1977

Language:

english

File:

PDF, 446 KB

english, 1977

16

Determination of subband spacing in inversion layers on p -type InAs

Bu, L., Zhang, Y., Mason, B. A., Doezema, R. E., Slinkman, J. A.

Journal:

Physical Review B

Year:

1992

Language:

english

File:

PDF, 93 KB

english, 1992

17

Calculated spin effects in wide parabolic quantum wells

Hembree, C. E., Mason, B. A., Kwiatkowski, J. T., Furneaux, J., Slinkman, J. A.

Journal:

Physical Review B

Year:

1993

Language:

english

File:

PDF, 197 KB

english, 1993

18

Motional binding in InAs with a realistic surface potential

Slinkman, J., Zhang, An-zhen, Doezema, R. E.

Journal:

Physical Review B

Year:

1989

Language:

english

File:

PDF, 197 KB

english, 1989

19

Can Agile and Traditional Systems Development Approaches Coexist? An Ambidextrous View

Vinekar, Vishnu, Slinkman, Craig W., Nerur, Sridhar

Journal:

Information Systems Management

Year:

2006

Language:

english

File:

PDF, 380 KB

english, 2006

20

[IEEE Proceedings of IEEE International Electron Devices Meeting - San Francisco, CA, USA (1989.12.3-1989.12.6)] International Technical Digest on Electron Devices Meeting - Retrograde well and epitaxial thickness optimization for shallow- and deep-trench collar merged isolation and node trench SPT DRAM cell and CMOS logic technology

Voldman,, Marceau,, Baker,, Adler,, Geissler,, Slinkman,, Johnson,, Paggi,

Year:

1992

Language:

english

File:

PDF, 336 KB

english, 1992

21

[IEEE 2015 IEEE 15th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) - San Diego, CA, USA (2015.1.26-2015.1.28)] 2015 IEEE 15th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Improvements in SOI technology for RF switches

Jaffe, Mark, Abou-Khalil, Michel, Botula, Alan, Ellis-Monaghan, John, Gambino, Jeffrey, Gross, Jeff, He, Zhong-Xiang, Joseph, Alvin, Phelps, Richard, Shank, Steven, Slinkman, James, Wolf, Randy

Year:

2015

Language:

english

File:

PDF, 950 KB

english, 2015

22

Expert Systems: A Question of Liability?

Kathleen Mykytyn, Peter P. Mykytyn, Jr. and Craig W. Slinkman

Journal:

Year:

1990

Language:

english

File:

PDF, 1.33 MB

english, 1990

23

The use of simulation in semiconductor technology development

D.C. Cole, E.M. Buturla, S.S. Furkay, K. Varahramyan, J. Slinkman, J.A. Mandelman, D.P. Foty, O. Bula, A.W. Strong, J.W. Park, T.D. Linton Jr, J.B. Johnson, M.V. Fischetti, S.E. Laux, P.E. Cottrell, H

Journal:

Solid-State Electronics

Year:

1990

Language:

english

File:

PDF, 6.14 MB

english, 1990

24

Three-dimensional transient electrothermal simulation of electrostatic discharge protection circuits

Steven H. Voldman, Stephen S. Furkay, James R. Slinkman

Journal:

Journal of Electrostatics

Year:

1995

Language:

english

File:

PDF, 1.60 MB

english, 1995

25

Modelling of impurity dopant density measurement in semiconductors by scanning force microscopy

Y.J. Huang, J. Slinkman, C.C. Williams

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 364 KB

english, 1992

26

Development of the Rural-Urban Demand Indicator (RUDI)

Nancy Burns, Kim Carney, Craig Slinkman

Journal:

Research in Nursing & Health

Year:

1998

Language:

english

File:

PDF, 251 KB

english, 1998

27

Studies of point defect/dislocation loop interaction processes in silicon

K.S. Jones, H.G. Robinson, J. Listebarger, J. Chen, J. Liu, B. Herner, H. Park, M.E. Law, D. Sieloff, J.A. Slinkman

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

1995

Language:

english

File:

PDF, 685 KB

english, 1995

28

DNA fingerprinting and terpenoid analysis of Juniperus blancoi var. huehuentensis (Cupressaceae), a new subalpine variety from Durango, Mexico

Robert P. Adams, M. Socorro González Elizondo, Martha González Elizondo, Erin Slinkman

Journal:

Biochemical Systematics and Ecology

Year:

2006

Language:

english

File:

PDF, 233 KB

english, 2006

29

Luncheon Address Consumer Electronics - Problems and Potentials

Journal:

IEEE Transactions on Broadcast and Television Receivers

Year:

1974

Language:

english

File:

PDF, 650 KB

english, 1974

30

Structure and Dynamics of a Magnetron DC Arc Plasma

Slinkman, David, Sacks, Richard

Journal:

Applied Spectroscopy

Year:

1990

Language:

english

File:

PDF, 857 KB

english, 1990

31

A Magnetron DC Arc Plasma for Aerosol Analysis

Slinkman, David, Sacks, Richard

Journal:

Applied Spectroscopy

Year:

1990

Language:

english

File:

PDF, 898 KB

english, 1990

32

Concomitant Effects in a Magnetron Rotating Direct-Current Arc Plasma with Graphite-Furnace Sample Introduction

Slinkman, David, Sacks, Richard

Journal:

Applied Spectroscopy

Year:

1991

Language:

english

File:

PDF, 729 KB

english, 1991

33

Excitation Temperatures and Electron Densities in a Magnetron Rotating Direct-Current Arc Plasma

Slinkman, David, Sacks, Richard

Journal:

Applied Spectroscopy

Year:

1991

Language:

english

File:

PDF, 789 KB

english, 1991

34

Hybrid Rotating Arc-Tube Furnace Device for Microsolution Analysis

Slinkman, David, Sacks, Richard

Journal:

Applied Spectroscopy

Year:

1991

Language:

english

File:

PDF, 473 KB

english, 1991

35

Evaluation of TV Contribution to the Annual Genetically Significant Radiation Dose of the Population

Broyles, M., Neely, O., Slinkman, R., Thierfelder, C.

Journal:

IEEE Transactions on Broadcast and Television Receivers

Year:

1970

Language:

english

File:

PDF, 1018 KB

english, 1970

36

Two‐dimensional surface dopant profiling in silicon using scanning Kelvin probe microscopy

Henning, Albert K., Hochwitz, Todd, Slinkman, James, Never, James, Hoffmann, Steven, Kaszuba, Phil, Daghlian, Charles

Journal:

Journal of Applied Physics

Year:

1995

Language:

english

File:

PDF, 1.50 MB

english, 1995

37

[IEEE Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting - Montreal, Canada (Sept. 12-14, 2004)] Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting - A low complexity 0.13 μ SiGe BiCMOS technology for wireless and mixed signal applications

Lanzerotti, L., Feilchenfeld, N., Coolbaugh, D., Slinkman, J., Gray, P., Sheridan, D., Higgins, J., Hodge, W., Gordon, M., Larsen, T., Gautsch, M., Lindgren, P., Murty, R., Rascoe, J., Watson, K., Sta

Year:

2004

Language:

english

File:

PDF, 248 KB

english, 2004

38

Effects of hydrostatic pressure on dopant diffusion in silicon

Park, Heemyong, Jones, Kevin S., Slinkman, Jim A., Law, Mark E.

Journal:

Journal of Applied Physics

Year:

1995

Language:

english

File:

PDF, 1.18 MB

english, 1995

39

Quantitative two-dimensional dopant profile measurement and inverse modeling by scanning capacitance microscopy

Huang, Y., Williams, C. C., Slinkman, J.

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 231 KB

english, 1995

40

Magnetic-field modulation of a two-electrode direct-current plasma

Slinkman, David, Braid, Fred, Sacks, Richard

Journal:

Spectrochimica Acta Part B: Atomic Spectroscopy

Year:

1990

Language:

english

File:

PDF, 1.54 MB

english, 1990

41

Direct analysis of solid powder biological samples using a magnetron rotating direct-current arc plasma and graphite furnace sample introduction

Slinkman, David., Sacks, Richard.

Journal:

Analytical Chemistry

Year:

1991

Language:

english

File:

PDF, 1.02 MB

english, 1991

42

[IEEE 2009 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF) - San Diego, California, USA (2009.01.19-2009.01.21)] 2009 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - A Thin-Film SOI 180nm CMOS RF Switch

Wolf, R., Joseph, A., Botula, A., Slinkman, J.

Year:

2009

Language:

english

File:

PDF, 274 KB

english, 2009

43

[IEEE Proceedings of 1995 IEEE International Reliability Physics Symposium - Las Vegas, NV (1995.04.4-1995.04.6)] 33rd IEEE International Reliability Physics Symposium - DRAM failure analysis with the force-based scanning Kelvin probe

Hochwitz, T., Henning, A.K., Daghlian, C., Bolam, R., Coutu, P., Gluck, R., Slinkman, J.

Year:

1995

Language:

english

File:

PDF, 851 KB

english, 1995

44

Magnetron rotating direct current arc using graphite furnace sample introduction for micro solution analysis

Slinkman, David., Sacks, Richard.

Journal:

Analytical Chemistry

Year:

1990

Language:

english

File:

PDF, 1.47 MB

english, 1990

45

[IEEE 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Monterey, CA (2008.10.13-2008.10.15)] 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Geometry scaling issues originated by extrinsic stress in SiGe HBTs

Malladi, Ramana, Slinkman, Jim A., Joseph, Alvin

Year:

2008

Language:

english

File:

PDF, 1.58 MB

english, 2008

46

[IEEE 1997 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (13-16 Oct. 1997)] 1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319) - Charge pumping for DRAM retention diagnostic

Adkisson, J., Divakaruni, R., Slinkman, J.

Year:

1997

Language:

english

File:

PDF, 534 KB

english, 1997

47

[IEEE 1994 IEEE International Electron Devices Meeting - San Francisco, CA, USA (11-14 Dec. 1994)] Proceedings of 1994 IEEE International Electron Devices Meeting - Quantum mechanical modeling of the charge distribution Si/Si/sub 1-x/Ge/sub x/Si p-channel MOSFET

Hargrove, M.J., Henning, A.K., Slinkman, J.A., Bean, J.C.

Year:

1994

Language:

english

File:

PDF, 374 KB

english, 1994

48

A cost based decision rule for deciding betwween two estmiators of μ y - μ x

Eakin, Mark, Slinkman, Craig, Pape, Elinor S.

Journal:

Communication in Statistics- Theory and Methods

Year:

1984

Language:

english

File:

PDF, 346 KB

english, 1984

49

[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - A technology simulation methodology for AC-performance optimization of SiGe HBTs

Johnson, J.B., Stricker, A., Joseph, A.J., Slinkman, J.A.

Year:

2001

Language:

english

File:

PDF, 363 KB

english, 2001

50

[IEEE IEEE International Electron Devices Meeting - Washington, DC, USA (5-8 Dec. 1993)] Proceedings of IEEE International Electron Devices Meeting - The effects of strain on dopant diffusion in silicon

Heemyong Park,, Jones, K.S., Slinkman, J.A., Law, M.E.

Year:

1993

Language:

english

File:

PDF, 445 KB

english, 1993

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